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Electrical performance and reliability aspects of strain engineered deep submicron CMOS technologies
Publication:
Electrical performance and reliability aspects of strain engineered deep submicron CMOS technologies
Date
2007
Proceedings Paper
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14860.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Claeys, Cor
;
Eneman, Geert
;
Bargallo Gonzalez, Mireia
;
Put, Sofie
;
Simoen, Eddy
Journal
Abstract
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Metrics
Views
1853
since deposited on 2021-10-16
412
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations