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Fabrication and characterization of ternary Cu8SiS6 and Cu8SiSe6 thin film layers for optoelectronic applications
Publication:
Fabrication and characterization of ternary Cu8SiS6 and Cu8SiSe6 thin film layers for optoelectronic applications
Date
2016
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Brammertz, Guy
;
Vermang, Bart
;
ElAnzeery, Hossam
;
Sahayaraj, Sylvester
;
Ranjbarrizi, Samaneh
;
Meuris, Marc
;
Poortmans, Jef
Journal
Thin Solid Films
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2022
since deposited on 2021-10-23
441
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Acq. date: 2025-10-24
Citations
Metrics
Views
2022
since deposited on 2021-10-23
441
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations