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Development of a novel wafer probe for in-situ measurements
Publication:
Development of a novel wafer probe for in-situ measurements
Date
2013
Presentation
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
El Otell, Ziad
;
Marinov, Daniil
;
Bowden, Mark
;
Samara, Vladimir
;
de Marneffe, Jean-Francois
;
Verdonck, Patrick
;
Braithwaite, Nicholas
Journal
Abstract
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1974
since deposited on 2021-10-21
Acq. date: 2025-10-23
Citations
Metrics
Views
1974
since deposited on 2021-10-21
Acq. date: 2025-10-23
Citations