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Transient sputter yields, build-up of the altered layer and Ge-segregation as a function of the O2+ ion-fluence SiGe
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Transient sputter yields, build-up of the altered layer and Ge-segregation as a function of the O2+ ion-fluence SiGe
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Date
2001
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Huyghebaert, Cedric
;
Brijs, Bert
;
Vandervorst, Wilfried
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1877
since deposited on 2021-10-14
Acq. date: 2025-12-15
Citations
Metrics
Views
1877
since deposited on 2021-10-14
Acq. date: 2025-12-15
Citations