Publication:

MEMS packaging and reliability: An undividable couple

Date

2012
Journal article
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Author(s)

Tilmans, Harrie  
;
De Coster, Jeroen  
;
Helin, Philippe  
;
Cherman, Vladimir  
;
Jourdain, Anne  
;
De Moor, Piet  
;
Vandevelde, Bart  
;
Pham, Nga  
;
Zekry, Joseph
;
Witvrouw, Ann
;
De Wolf, Ingrid  

Journal

Microelectronics Reliability

Abstract

Description

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1991 since deposited on 2021-10-20
6last month
Acq. date: 2026-08-14

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