Publication:
Time dependent dielectric breakdown and stress induced leakage current characteristics of 0.7nm EOT HfO2 pFETs
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1930 since deposited on 2021-10-19
1last month
Acq. date: 2025-12-11
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Metrics
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1930 since deposited on 2021-10-19
1last month
Acq. date: 2025-12-11
Citations