Publication:
Time dependent dielectric breakdown and stress induced leakage current characteristics of 0.7nm EOT HfO2 pFETs
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1931 since deposited on 2021-10-19
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Acq. date: 2026-02-25
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Statistics
Views
1931 since deposited on 2021-10-19
1last month
1last week
Acq. date: 2026-02-25
Citations