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Nondestructive stiffness and density characterization of porous low-K films by surface acoustic wave spectroscopy
Publication:
Nondestructive stiffness and density characterization of porous low-K films by surface acoustic wave spectroscopy
Date
2002
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Flannery, C. M.
;
Baklanov, Mikhaïl
Journal
Abstract
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1959
since deposited on 2021-10-14
Acq. date: 2025-10-26
Citations
Metrics
Views
1959
since deposited on 2021-10-14
Acq. date: 2025-10-26
Citations