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Gate-sided hydrogen release as the origin of "permanent" NBTI degradation: from single defects to lifetimes
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1997 since deposited on 2021-10-22
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Acq. date: 2026-03-01
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Statistics
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1997 since deposited on 2021-10-22
2last month
1last week
Acq. date: 2026-03-01
Citations