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Impact of starting measurement voltage relative to flat-band voltage position on the capacitance-voltage hysteresis and on the defect characterization of InGaAs/high-k metal-oxide-semiconductor stacks
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1 since deposited on 2021-10-22
Acq. date: 2026-01-09
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1773 since deposited on 2021-10-22
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Acq. date: 2026-01-09
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1 since deposited on 2021-10-22
Acq. date: 2026-01-09
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1773 since deposited on 2021-10-22
1last month
Acq. date: 2026-01-09
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