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Back gate voltage influence on the LDD SOI NMOSFET series resistance extraction from 150 to 300 K
Publication:
Back gate voltage influence on the LDD SOI NMOSFET series resistance extraction from 150 to 300 K
Date
1998
Presentation
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Nicolett, A. S.
;
Martino, Joao Antonio
;
Simoen, Eddy
;
Claeys, C.
Journal
Abstract
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2090
since deposited on 2021-10-01
Acq. date: 2025-10-23
Citations
Metrics
Views
2090
since deposited on 2021-10-01
Acq. date: 2025-10-23
Citations