Publication:
Back gate voltage influence on the LDD SOI NMOSFET series resistance extraction from 150 to 300 K
Date
| dc.contributor.author | Nicolett, A. S. | |
| dc.contributor.author | Martino, Joao Antonio | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, C. | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-01T08:33:30Z | |
| dc.date.available | 2021-10-01T08:33:30Z | |
| dc.date.issued | 1998 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/2804 | |
| dc.source.conference | NATO Advanced Research Workshop on "Perspectives, Sciences and Technologies of Novel Silicon-on-Insulator Devices"; 12-15 Octobe | |
| dc.source.conferencelocation | ||
| dc.title | Back gate voltage influence on the LDD SOI NMOSFET series resistance extraction from 150 to 300 K | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
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