Publication:

Modeling Carrier In- and Ejection for Charge Trap Flash Memory: Insights from Engineered SON(ON)OS Vehicles

Date

2025
Proceedings Paper
https://doi.org/10.1109/sispad66650.2025.11186329
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dc.contributor.authorHellemans, Thomas
dc.contributor.authorVerreck, Devin
dc.contributor.authorArreghini, Antonio
dc.contributor.authorVan Den Bosch, Geert
dc.contributor.authorRosmeulen, Maarten
dc.contributor.authorHoussa, Michel
dc.contributor.authorVan Houdt, Jan
dc.date.accessioned2026-09-14T11:08:29Z
dc.date.available2026-09-14T11:08:29Z
dc.date.createdwos2026
dc.date.issued2025
dc.description.abstractDespite charge trap flash memories being commercialized, the detailed understanding of the underlying physics remains limited. Here, we therefore evaluate common assumptions for the in- and ejection of charge carriers in the trapping layer, by comparing to measurements of both standard SONOS and engineered SONONOS devices. We find a strong impact of these assumptions on the peak of the trapped charge profile as well as on the accumulation near the blocking oxide. Finally, we highlight the need for a non-local detrapping model.
dc.description.wosFundingTextThis work was supported by imec's Industrial Affiliation Program for storage memories and Fonds Wetenschappelijk Onderzoek (FWO) Vlaanderen under grant number 1SS0925N.
dc.identifier.doi10.1109/sispad66650.2025.11186329
dc.identifier.isbn979-8-3315-4884-1
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/60337
dc.language.isoeng
dc.provenance.editstepusergreet.vanhoof@imec.be
dc.publisherIEEE
dc.source.beginpage1
dc.source.conferenceInternational Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
dc.source.conferencedate2025-09-24
dc.source.conferencelocationMadrid
dc.source.endpage4
dc.source.journal2025 INTERNATIONAL CONFERENCE ON SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES, SISPAD
dc.source.numberofpages4
dc.title

Modeling Carrier In- and Ejection for Charge Trap Flash Memory: Insights from Engineered SON(ON)OS Vehicles

dc.typeProceedings paper
dspace.entity.typePublication
imec.internal.crawledAt2025-10-22
imec.internal.sourcecrawler
imec.internal.wosCreatedAt2026-09-13
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