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Atomic layer deposition: nucleation and growth behavior of HfO2 dielectrics on semiconductor surfaces
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Atomic layer deposition: nucleation and growth behavior of HfO2 dielectrics on semiconductor surfaces
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Date
2009-06
Dissertation
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18523.pdf
1.89 MB
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Nyns, Laura
Journal
Abstract
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1964
since deposited on 2021-10-18
1
last month
Acq. date: 2025-12-16
Citations
Metrics
Views
1964
since deposited on 2021-10-18
1
last month
Acq. date: 2025-12-16
Citations