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Gate voltage and geometry dependence of the series resistance and of the carrier mobility in FinFET devices
Publication:
Gate voltage and geometry dependence of the series resistance and of the carrier mobility in FinFET devices
Date
2008
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Magnone, Paolo
;
Subramanian, Vaidy
;
Parvais, Bertrand
;
Mercha, Abdelkarim
;
Pace, Calogero
;
Dehan, Morin
;
Decoutere, Stefaan
;
Groeseneken, Guido
;
Crupi, Felice
;
Pierro, Silvio
Journal
Microelectronic Engineering
Abstract
Description
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2036
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
2036
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations