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Determination of optical constants of thin films in the EUV
Publication:
Determination of optical constants of thin films in the EUV
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Date
2022
Journal article
https://doi.org/10.1364/AO.447152
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ciesielski, Richard
;
Saadeh, Qais
;
Philipsen, Vicky
;
Opsomer, Karl
;
Soulie, Jean-Philippe
;
Wu, Meiyi
;
Naujok, Philipp
;
van de Kruijs, Robbert W. E.
;
Detavernier, Christophe
;
Kolbe, Michael
;
Scholze, Frank
;
Soltwisch, Victor
Journal
APPLIED OPTICS
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220
since deposited on 2022-03-26
79
last month
8
last week
Acq. date: 2026-01-06
Views
1822
since deposited on 2022-03-26
4
last month
1
last week
Acq. date: 2026-01-06
Citations