Assessment of DC and low frequency noise performances of triple-gate FinFETs at cryogenic temperatures

Publication:

2016

Journal article

Author(s)

Cretu, Bogdan

;

Boudier, Dimitri

;

;

;

Semiconductor Science and Technology

2000 since deposited on 2021-10-23

1last month

Acq. date: 2026-05-01