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Assessment of DC and low frequency noise performances of triple-gate FinFETs at cryogenic temperatures
Publication:
Assessment of DC and low frequency noise performances of triple-gate FinFETs at cryogenic temperatures
Date
2016
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Cretu, Bogdan
;
Boudier, Dimitri
;
Simoen, Eddy
;
Veloso, Anabela
;
Collaert, Nadine
Journal
Semiconductor Science and Technology
Abstract
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1999
since deposited on 2021-10-23
Acq. date: 2025-12-08
Citations
Metrics
Views
1999
since deposited on 2021-10-23
Acq. date: 2025-12-08
Citations