Assessment of DC and low frequency noise performances of triple-gate FinFETs at cryogenic temperatures

dc.contributor.author	Cretu, Bogdan
dc.contributor.author	Boudier, Dimitri
dc.contributor.author	Simoen, Eddy
dc.contributor.author	Veloso, Anabela
dc.contributor.author	Collaert, Nadine
dc.contributor.imecauthor	Simoen, Eddy
dc.contributor.imecauthor	Veloso, Anabela
dc.contributor.imecauthor	Collaert, Nadine
dc.contributor.orcidimec	Simoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimec	Collaert, Nadine::0000-0002-8062-3165
dc.date.accessioned	2021-10-23T10:23:33Z
dc.date.available	2021-10-23T10:23:33Z
dc.date.issued	2016
dc.identifier.issn	0268-1242
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/26483
dc.identifier.url	http://iopscience.iop.org/article/10.1088/0268-1242/31/12/124006
dc.source.beginpage	124006
dc.source.issue	12
dc.source.journal	Semiconductor Science and Technology
dc.source.volume	31
dc.title	Assessment of DC and low frequency noise performances of triple-gate FinFETs at cryogenic temperatures
dc.type	Journal article
dspace.entity.type	Publication
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