Publication:
SPICE modelling of hot-carrier degradation in Si1-xGex S/D and HfSiON based pMOS transistors
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1907 since deposited on 2021-10-18
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Acq. date: 2026-03-16
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Statistics
Views
1907 since deposited on 2021-10-18
2last month
1last week
Acq. date: 2026-03-16
Citations