Publication:
SPICE modelling of hot-carrier degradation in Si1-xGex S/D and HfSiON based pMOS transistors
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1898 since deposited on 2021-10-18
Acq. date: 2025-10-23
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Views
1898 since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations