Publication:
SPICE modelling of hot-carrier degradation in Si1-xGex S/D and HfSiON based pMOS transistors
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1906 since deposited on 2021-10-18
3last month
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Acq. date: 2026-02-24
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Statistics
Views
1906 since deposited on 2021-10-18
3last month
1last week
Acq. date: 2026-02-24
Citations