Publication:
SPICE modelling of hot-carrier degradation in Si1-xGex S/D and HfSiON based pMOS transistors
Date
| dc.contributor.author | Martin-Martinez, J. | |
| dc.contributor.author | Amat, E. | |
| dc.contributor.author | Gonzalez, Mario | |
| dc.contributor.author | Verheyen, Peter | |
| dc.contributor.author | Rooyackers, Rita | |
| dc.contributor.author | Rodriguez, R. | |
| dc.contributor.author | Nafria, M. | |
| dc.contributor.author | Aymerich, X. | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.imecauthor | Gonzalez, Mario | |
| dc.contributor.imecauthor | Verheyen, Peter | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-18T18:53:54Z | |
| dc.date.available | 2021-10-18T18:53:54Z | |
| dc.date.issued | 2010 | |
| dc.identifier.issn | 0026-2714 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/17593 | |
| dc.source.beginpage | 1263 | |
| dc.source.endpage | 1266 | |
| dc.source.issue | 9_11 | |
| dc.source.journal | Microelectronics Reliability | |
| dc.source.volume | 50 | |
| dc.title | SPICE modelling of hot-carrier degradation in Si1-xGex S/D and HfSiON based pMOS transistors | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |