Publication:

Total-Ionizing-Dose Effects in IGZO Thin-Film Transistors With SiO2 Oxygen-Penetration Layers

Date

2024

Journal article

https://doi.org/10.1109/TNS.2023.3346825

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Author(s)

;

;

Vaisman Chasin, Adrian

;

Linten, Dimitri

;

Belmonte, Attilio

;

Kar, Gouri Sankar

;

Reed, Robert A.

;

Schrimpf, Ronald D.

;

Fleetwood, Daniel M.

Journal

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Metrics

520 since deposited on 2024-06-23

Acq. date: 2025-12-09