Total-Ionizing-Dose Effects in IGZO Thin-Film Transistors With SiO2 Oxygen-Penetration Layers

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Author(s)

;

;

Vaisman Chasin, Adrian

;

Linten, Dimitri

;

Belmonte, Attilio

;

Kar, Gouri Sankar

;

Reed, Robert A.

;

Schrimpf, Ronald D.

;

Fleetwood, Daniel M.

Journal

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Metrics

517 since deposited on 2024-06-23

Acq. date: 2025-10-24