Publication:

Optimal frequency range selection for full C-V characterization above 45MHz for ultra thin (1.2-nm) nitrided oxide MOSFETs

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1940 since deposited on 2021-10-15
Acq. date: 2025-10-23

Citations

Metrics

Views

1940 since deposited on 2021-10-15
Acq. date: 2025-10-23

Citations