Publication:
Optimal frequency range selection for full C-V characterization above 45MHz for ultra thin (1.2-nm) nitrided oxide MOSFETs
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1944 since deposited on 2021-10-15
Acq. date: 2026-01-06
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Views
1944 since deposited on 2021-10-15
Acq. date: 2026-01-06
Citations