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Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design
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1824 since deposited on 2021-10-16
2last month
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Acq. date: 2026-04-06
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Views
1824 since deposited on 2021-10-16
2last month
1last week
Acq. date: 2026-04-06
Citations