Publication:
Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design
Date
| dc.contributor.author | Papanikolaou, Antonis | |
| dc.date.accessioned | 2021-10-16T18:27:22Z | |
| dc.date.available | 2021-10-16T18:27:22Z | |
| dc.date.issued | 2007 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/12671 | |
| dc.source.conference | MEDEA+ Design Automation Conference | |
| dc.source.conferencedate | 21/05/2007 | |
| dc.source.conferencelocation | Grenoble France | |
| dc.title | Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
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