Publication:
On ESD gate dielectric reliability in 14nm finFET and horizontal NW technology
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1839 since deposited on 2021-10-25
2last month
1last week
Acq. date: 2026-08-07
Citations
Statistics
Views
1839 since deposited on 2021-10-25
2last month
1last week
Acq. date: 2026-08-07
Citations