Publication:

Scaling of E-mode power GaN-HEMTs for low voltage/low Ron applications: Implications on robustness

Date

2023

Journal article

https://doi.org/10.1016/j.microrel.2023.115133

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Author(s)

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De Santi, Carlo

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;

Bakeroot, Benoit

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Kuzma Filipek, Izabela

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Posthuma, Niels

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Decoutere, Stefaan

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Meneghesso, Gaudenzio

;

;

Meneghini, Matteo

Journal

MICROELECTRONICS RELIABILITY

Metrics

857 since deposited on 2023-12-05

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Acq. date: 2026-01-06