Publication:
Scaling of E-mode power GaN-HEMTs for low voltage/low Ron applications: Implications on robustness
| dc.contributor.author | Benato, Andrea | |
| dc.contributor.author | De Santi, Carlo | |
| dc.contributor.author | Borga, Matteo | |
| dc.contributor.author | Bakeroot, Benoit | |
| dc.contributor.author | Kuzma Filipek, Izabela | |
| dc.contributor.author | Posthuma, Niels | |
| dc.contributor.author | Decoutere, Stefaan | |
| dc.contributor.author | Meneghesso, Gaudenzio | |
| dc.contributor.author | Zanoni, Enrico | |
| dc.contributor.author | Meneghini, Matteo | |
| dc.contributor.imecauthor | Borga, Matteo | |
| dc.contributor.imecauthor | Bakeroot, Benoit | |
| dc.contributor.imecauthor | Posthuma, Niels | |
| dc.contributor.imecauthor | Decoutere, Stefaan | |
| dc.contributor.imecauthor | Kuzma Filipek, Izabela | |
| dc.contributor.orcidimec | Borga, Matteo::0000-0003-3087-6612 | |
| dc.contributor.orcidimec | Bakeroot, Benoit::0000-0003-4392-1777 | |
| dc.contributor.orcidimec | Posthuma, Niels::0000-0002-6029-1909 | |
| dc.contributor.orcidimec | Decoutere, Stefaan::0000-0001-6632-6239 | |
| dc.date.accessioned | 2024-03-11T15:48:25Z | |
| dc.date.available | 2023-12-05T17:25:36Z | |
| dc.date.available | 2024-03-11T15:48:25Z | |
| dc.date.issued | 2023 | |
| dc.description.wosFundingText | This activity was supported by project iRel40. iRel40 is a European co-funded innovation project that has been granted by the ECSEL Joint Undertaking (JU) under grant agreement No 876659. The funding of the project comes from the Horizon 2020 research program and participating countries. National funding is provided by Germany, including the Free States of Saxony and Thuringia, Austria, Belgium, Finland, France, Italy, the Netherlands, Slovakia, Spain, Sweden, and Turkey. This project is co -funded by the Ministry of Economic Development in Italy. | |
| dc.identifier.doi | 10.1016/j.microrel.2023.115133 | |
| dc.identifier.issn | 0026-2714 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/43223 | |
| dc.publisher | PERGAMON-ELSEVIER SCIENCE LTD | |
| dc.source.beginpage | Art. 115133 | |
| dc.source.endpage | N/A | |
| dc.source.issue | November | |
| dc.source.journal | MICROELECTRONICS RELIABILITY | |
| dc.source.numberofpages | 5 | |
| dc.source.volume | 150 | |
| dc.subject.keywords | MIS-HEMTS | |
| dc.subject.keywords | F(T)/F(MAX) | |
| dc.title | Scaling of E-mode power GaN-HEMTs for low voltage/low Ron applications: Implications on robustness | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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