Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Spectroscopic critical dimension technology (SCD) for directed self assembly
Publication:
Spectroscopic critical dimension technology (SCD) for directed self assembly
Copy permalink
Date
2014
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
27899.pdf
2.37 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Nishibe, Senichi
;
Dziura, Thaddeus
;
Nagaswami, Venkat
;
Gronheid, Roel
Journal
Abstract
Description
Metrics
Views
1875
since deposited on 2021-10-22
Acq. date: 2025-12-11
Citations
Metrics
Views
1875
since deposited on 2021-10-22
Acq. date: 2025-12-11
Citations