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Study of breakdown effects in silicon multiguard structures
Publication:
Study of breakdown effects in silicon multiguard structures
Date
1999
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Da Rold, Martina
;
Bacchetta, N.
;
Bisello, D.
;
Paccagnella, A.
;
Dalla Betta, G. F.
;
Verzellesi, G.
;
Militaru, O.
;
Wheadon, R.
;
Fuochi, P. G.
;
Bozzi, C.
;
Dell'Orso, R.
;
Messineo, A.
;
Tonelli, G.
;
Verdini, P. G.
Journal
IEEE Trans. Nuclear Science
Abstract
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2009
since deposited on 2021-10-06
Acq. date: 2025-10-23
Citations
Metrics
Views
2009
since deposited on 2021-10-06
Acq. date: 2025-10-23
Citations