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Study of breakdown effects in silicon multiguard structures

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dc.contributor.authorDa Rold, Martina
dc.contributor.authorBacchetta, N.
dc.contributor.authorBisello, D.
dc.contributor.authorPaccagnella, A.
dc.contributor.authorDalla Betta, G. F.
dc.contributor.authorVerzellesi, G.
dc.contributor.authorMilitaru, O.
dc.contributor.authorWheadon, R.
dc.contributor.authorFuochi, P. G.
dc.contributor.authorBozzi, C.
dc.contributor.authorDell'Orso, R.
dc.contributor.authorMessineo, A.
dc.contributor.authorTonelli, G.
dc.contributor.authorVerdini, P. G.
dc.date.accessioned2021-10-06T10:51:42Z
dc.date.available2021-10-06T10:51:42Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3328
dc.source.beginpage1215
dc.source.endpage1223
dc.source.issue4, Pt.3
dc.source.journalIEEE Trans. Nuclear Science
dc.source.volume46
dc.title

Study of breakdown effects in silicon multiguard structures

dc.typeJournal article
dspace.entity.typePublication
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