Publication:
Characterization of electron traps in Si-capped Ge MOSFETs with HfO2/SiO2 gate stack
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1868 since deposited on 2021-10-20
3last month
Acq. date: 2026-04-05
Citations
Statistics
Views
1868 since deposited on 2021-10-20
3last month
Acq. date: 2026-04-05
Citations