Publication:
A global description of the base current 1/f noise of polysilicon emitter bipolar transistors before and after hot-carrier stress
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1921 since deposited on 2021-10-01
2last month
Acq. date: 2026-01-07
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Views
1921 since deposited on 2021-10-01
2last month
Acq. date: 2026-01-07
Citations