Publication:

Device Aware Diagnosis for Unique Defects in STT-MRAMs

Date

2023

Proceedings Paper

https://doi.org/10.1109/ats59501.2023.10317952

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Author(s)

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Fieback, Moritz

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Marinissen, Erik Jan

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Couet, Sebastien

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Taouil, Mottaqiallah

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Journal

N/A

Statistics

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Acq. date: 2026-09-20