Publication:

Device Aware Diagnosis for Unique Defects in STT-MRAMs

Date

2023
Proceedings Paper
https://doi.org/10.1109/ATS59501.2023.10317952
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dc.contributor.authorAouichi, Ahmed
dc.contributor.authorYuan, Sicong
dc.contributor.authorFieback, Moritz
dc.contributor.authorRao, Siddharth
dc.contributor.authorKim, Woojin
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorCouet, Sebastien
dc.contributor.authorTaouil, Mottaqiallah
dc.contributor.authorHamdioui, Said
dc.contributor.imecauthorRao, Siddharth
dc.contributor.imecauthorKim, Woojin
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.imecauthorCouet, Sebastien
dc.contributor.orcidimecRao, Siddharth::0000-0001-6161-3052
dc.contributor.orcidimecKim, Woojin::0000-0002-2755-6661
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.contributor.orcidimecCouet, Sebastien::0000-0001-6436-9593
dc.date.accessioned2024-03-21T13:56:08Z
dc.date.available2024-01-22T17:51:06Z
dc.date.available2024-03-21T13:56:08Z
dc.date.issued2023
dc.description.wosFundingTextThis work is supported by IMEC's Industrial Affiliation Program on STT-MRAM devices.
dc.identifier.doi10.1109/ATS59501.2023.10317952
dc.identifier.eisbn979-8-3503-0310-0
dc.identifier.issn1081-7735
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/43441
dc.publisherIEEE
dc.source.beginpage71
dc.source.conference32nd IEEE Asian Test Symposium (ATS)
dc.source.conferencedateOCT 14-17, 2023
dc.source.conferencelocationBeijing
dc.source.endpage76
dc.source.journalN/A
dc.source.numberofpages6
dc.title

Device Aware Diagnosis for Unique Defects in STT-MRAMs

dc.typeProceedings paper
dspace.entity.typePublication
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