Publication:

Plasma etch challenges of Directed Self-Assembly (DSA) for fin and contact holes patterning in 7nm (N7) technology node

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1828 since deposited on 2021-10-22
Acq. date: 2026-02-24

Citations

Statistics

Views

1828 since deposited on 2021-10-22
Acq. date: 2026-02-24

Citations