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Plasma etch challenges of Directed Self-Assembly (DSA) for fin and contact holes patterning in 7nm (N7) technology node
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Plasma etch challenges of Directed Self-Assembly (DSA) for fin and contact holes patterning in 7nm (N7) technology node
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Date
2014
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chan, BT
;
Sayan, Safak
;
Bekaert, Joost
;
Doise, Jan
;
Gronheid, Roel
;
de Marneffe, Jean-Francois
;
Xu, Kaidong
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Views
1828
since deposited on 2021-10-22
2
last month
2
last week
Acq. date: 2026-01-10
Citations