Publication:

Analysis of tunneling currents and reliability of NMOSFET's with sub-2 nm gate oxides

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1847 since deposited on 2021-10-14
Acq. date: 2025-10-23

Citations

Metrics

Views

1847 since deposited on 2021-10-14
Acq. date: 2025-10-23

Citations