Publication:
Analysis of tunneling currents and reliability of NMOSFET's with sub-2 nm gate oxides
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1850 since deposited on 2021-10-14
1last month
Acq. date: 2026-08-16
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Statistics
Views
1850 since deposited on 2021-10-14
1last month
Acq. date: 2026-08-16
Citations