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Analysis of tunneling currents and reliability of NMOSFET's with sub-2 nm gate oxides
Publication:
Analysis of tunneling currents and reliability of NMOSFET's with sub-2 nm gate oxides
Date
1999
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Yang, N.
;
Henson, W. K.
;
Wortman, J. J.
Journal
Abstract
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1847
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1847
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations