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Barrier reliability on sub-100nm copper low-k interconnects
Publication:
Barrier reliability on sub-100nm copper low-k interconnects
Date
2004
Presentation
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Tokei, Zsolt
;
Gailledrat, T.
;
Li, Yunlong
;
Schuhmacher, Jorg
;
Mandrekar, T.
;
Guggilla, S.
;
Mebarki, Bencherki
;
Maex, Karen
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2053
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations
Metrics
Views
2053
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations