Publication:

Negative-Bias-Stress and Total-Ionizing-Dose Effects in Deeply Scaled Ge-GAA Nanowire pFETs

Date

2022

Journal article

https://doi.org/10.1109/TNS.2022.3144204

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Author(s)

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Toguchi, Shintaro

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Linten, Dimitri

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Reed, Robert A.

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Fleetwood, Daniel M.

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Schrimpf, Ronald D.

Journal

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

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Acq. date: 2026-05-18