Publication:
Negative-Bias-Stress and Total-Ionizing-Dose Effects in Deeply Scaled Ge-GAA Nanowire pFETs
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1811 since deposited on 2022-03-30
Acq. date: 2025-10-23
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Views
1811 since deposited on 2022-03-30
Acq. date: 2025-10-23
Citations