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Mathematical description of atomic layer deposition and its application to the nucleation and growth of HfO2 gate dielectric layers

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dc.contributor.authorAlam, M.A.
dc.contributor.authorGreen, Martin
dc.date.accessioned2021-10-15T03:58:42Z
dc.date.available2021-10-15T03:58:42Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7128
dc.source.beginpage3403
dc.source.endpage3413
dc.source.issue5
dc.source.journalJournal of Applied Physics
dc.source.volume94
dc.title

Mathematical description of atomic layer deposition and its application to the nucleation and growth of HfO2 gate dielectric layers

dc.typeJournal article
dspace.entity.typePublication
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