Publication:

Understanding and physical modeling superior hot-carrier reliability of Ge pNWFETs

Date

2019

Proceedings Paper

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Author(s)

Tyaginov, Stanislav

;

El-Sayed, Al-Moatasem

;

Makarov, Alexander

;

Vaisman Chasin, Adrian

;

Arimura, Hiroaki

;

Vandemaele, Michiel

;

;

Capogreco, Elena

;

Witters, Liesbeth

;

Grill, Alexander

;

De Keersgieter, An

;

;

Linten, Dimitri

;

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1953 since deposited on 2021-10-27

1last month

Acq. date: 2026-01-26