Publication:

Understanding and physical modeling superior hot-carrier reliability of Ge pNWFETs

Date

2019
Proceedings Paper
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Author(s)

Tyaginov, Stanislav  
;
El-Sayed, Al-Moatasem
;
Makarov, Alexander
;
Vaisman Chasin, Adrian  
;
Arimura, Hiroaki  
;
Vandemaele, Michiel  
;
Jech, Markus
;
Capogreco, Elena  
;
Witters, Liesbeth  
;
Grill, Alexander  
;
De Keersgieter, An  
;
Eneman, Geert  
;
Linten, Dimitri  
;
Kaczer, Ben  

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1958 since deposited on 2021-10-27
5last month
Acq. date: 2026-08-29

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