Publication:
Understanding and physical modeling superior hot-carrier reliability of Ge pNWFETs
Date
| dc.contributor.author | Tyaginov, Stanislav | |
| dc.contributor.author | El-Sayed, Al-Moatasem | |
| dc.contributor.author | Makarov, Alexander | |
| dc.contributor.author | Vaisman Chasin, Adrian | |
| dc.contributor.author | Arimura, Hiroaki | |
| dc.contributor.author | Vandemaele, Michiel | |
| dc.contributor.author | Jech, Markus | |
| dc.contributor.author | Capogreco, Elena | |
| dc.contributor.author | Witters, Liesbeth | |
| dc.contributor.author | Grill, Alexander | |
| dc.contributor.author | De Keersgieter, An | |
| dc.contributor.author | Eneman, Geert | |
| dc.contributor.author | Linten, Dimitri | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.imecauthor | Tyaginov, Stanislav | |
| dc.contributor.imecauthor | Vaisman Chasin, Adrian | |
| dc.contributor.imecauthor | Arimura, Hiroaki | |
| dc.contributor.imecauthor | Vandemaele, Michiel | |
| dc.contributor.imecauthor | Capogreco, Elena | |
| dc.contributor.imecauthor | Witters, Liesbeth | |
| dc.contributor.imecauthor | Grill, Alexander | |
| dc.contributor.imecauthor | De Keersgieter, An | |
| dc.contributor.imecauthor | Eneman, Geert | |
| dc.contributor.imecauthor | Linten, Dimitri | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.orcidimec | Vaisman Chasin, Adrian::0000-0002-9940-0260 | |
| dc.contributor.orcidimec | Vandemaele, Michiel::0000-0003-0740-4115 | |
| dc.contributor.orcidimec | Grill, Alexander::0000-0003-1615-1033 | |
| dc.contributor.orcidimec | De Keersgieter, An::0000-0002-5527-8582 | |
| dc.contributor.orcidimec | Eneman, Geert::0000-0002-5849-3384 | |
| dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.date.accessioned | 2021-10-27T20:05:02Z | |
| dc.date.available | 2021-10-27T20:05:02Z | |
| dc.date.issued | 2019 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/34160 | |
| dc.identifier.url | https://ieeexplore.ieee.org/document/8993644 | |
| dc.source.beginpage | 21.3.1 | |
| dc.source.conference | IEEE Internaitonal Electron Devices Meeting - IEDM | |
| dc.source.conferencedate | 7/12/2019 | |
| dc.source.conferencelocation | San Francisco, CA USA | |
| dc.source.endpage | 21.3.4 | |
| dc.title | Understanding and physical modeling superior hot-carrier reliability of Ge pNWFETs | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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