Publication:

Transmission electron microscopic study of new FeSi2 and TiSi2 phases prepared by ion implantation

Date

1998
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorJin, S.
dc.contributor.authorBender, Hugo
dc.contributor.authorLi, X.
dc.contributor.authorDong, C.
dc.contributor.authorZhang, Zheng
dc.contributor.imecauthorBender, Hugo
dc.date.accessioned2021-09-30T12:16:52Z
dc.date.available2021-09-30T12:16:52Z
dc.date.embargo9999-12-31
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2653
dc.source.beginpage260
dc.source.conferenceElectron Microscopy 96; Proceedings of EUREM-11, the 11th Conference on Electron Microscopy
dc.source.conferencedate26/08/1996
dc.source.conferencelocationDublin Ireland
dc.source.endpage261
dc.title

Transmission electron microscopic study of new FeSi2 and TiSi2 phases prepared by ion implantation

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
2389.pdf
Size:
81.62 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions