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Composition analysis of III-V materials grown in nanostructures for semiconductor applications: the self focusing SIMS approach
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Composition analysis of III-V materials grown in nanostructures for semiconductor applications: the self focusing SIMS approach
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Date
2015
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Franquet, Alexis
;
Douhard, Bastien
;
Merckling, Clement
;
Conard, Thierry
;
Vandervorst, Wilfried
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1873
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Views
1873
since deposited on 2021-10-22
1
last month
Acq. date: 2025-12-15
Citations