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Single exposure EUV block downscaling for metal pitches below 32nm
Publication:
Single exposure EUV block downscaling for metal pitches below 32nm
Date
2017
Proceedings Paper
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37543.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Franke, Joern-Holger
;
Colsters, Paul
;
Bekaert, Joost
;
Hendrickx, Eric
;
Wittebrood, F.
;
Pathak, Abhinav
;
Schiffelers, Guido
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1927
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Metrics
Views
1927
since deposited on 2021-10-24
442
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations