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On the temperature and field dependence of trap-assisted tunneling current in Ge p+n junctions
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On the temperature and field dependence of trap-assisted tunneling current in Ge p+n junctions
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Date
2009
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
De Stefano, Francesca
;
Eneman, Geert
;
De Jaeger, Brice
;
Claeys, Cor
;
Crupi, Felice
Journal
IEEE Electron Device Letters
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1910
since deposited on 2021-10-18
2
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Acq. date: 2025-12-15
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Metrics
Views
1910
since deposited on 2021-10-18
2
last month
Acq. date: 2025-12-15
Citations