Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Structural and electrical characterization of carbon nanotube interconnects by combined transmission electron microscopy and scanning spreading resistance microscopy
Publication:
Structural and electrical characterization of carbon nanotube interconnects by combined transmission electron microscopy and scanning spreading resistance microscopy
Copy permalink
Date
2011
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
22426.pdf
2.44 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hantschel, Thomas
;
Ke, Xiaoxing
;
Chiodarelli, Nicolo
;
Schulze, Andreas
;
Bender, Hugo
;
Eyben, Pierre
;
Bals, Sara
;
Vandervorst, Wilfried
Journal
Abstract
Description
Metrics
Views
1928
since deposited on 2021-10-19
Acq. date: 2025-12-10
Citations
Metrics
Views
1928
since deposited on 2021-10-19
Acq. date: 2025-12-10
Citations