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Conference contributions
Energy and angular dependence of the sputter yield and ionization yield of Ge bombarded by O2+
Publication:
Energy and angular dependence of the sputter yield and ionization yield of Ge bombarded by O2+
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Date
2004
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Huyghebaert, Cedric
;
Conard, Thierry
;
Vandervorst, Wilfried
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1795
since deposited on 2021-10-15
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Acq. date: 2026-01-11
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Metrics
Views
1795
since deposited on 2021-10-15
1
last month
Acq. date: 2026-01-11
Citations