Publication:

Stochastic modeling of hot-carrier degradation in nFinFETs considering the impact of random traps and random dopants

Date

2019
Proceedings Paper
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Author(s)

Makarov, Alexander
;
Kaczer, Ben  
;
Roussel, Philippe  
;
Vaisman Chasin, Adrian  
;
Vandemaele, Michiel  
;
Hellings, Geert  
;
El-Sayed, Al-Moatasem
;
Jech, Markus
;
Grasser, Tibor
;
Linten, Dimitri  
;
Tyaginov, Stanislav  

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1996 since deposited on 2021-10-27
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Acq. date: 2026-10-08

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