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Physical characterization of ALD Al2O3 films deposited on GaAs substrates
Publication:
Physical characterization of ALD Al2O3 films deposited on GaAs substrates
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Date
2008
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Franquet, Alexis
;
Conard, Thierry
;
Vandervorst, Wilfried
;
Sioncke, Sonja
;
Caymax, Matty
;
Delabie, Annelies
;
Heyns, Marc
;
Meuris, Marc
;
Brammertz, Guy
;
Van Hemmen, J.L.
;
Keuning, W
;
Kessels, W.M.M.
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1830
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Acq. date: 2025-12-10
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Metrics
Views
1830
since deposited on 2021-10-17
1
last month
Acq. date: 2025-12-10
Citations