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Integrated optics in a standard MCM-D motherboard technology demonstrated in O/E measurement probes
Publication:
Integrated optics in a standard MCM-D motherboard technology demonstrated in O/E measurement probes
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Date
2003
Proceedings Paper
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8640.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Pauw, Herbert
;
De Baets, Johan
;
Vanfleteren, Jan
;
Van Calster, Andre
Journal
Abstract
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1893
since deposited on 2021-10-15
Acq. date: 2025-12-16
Citations
Metrics
Views
1893
since deposited on 2021-10-15
Acq. date: 2025-12-16
Citations