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Influence of porosity on VUV induced damage to low-k dielectrics
Publication:
Influence of porosity on VUV induced damage to low-k dielectrics
Date
2015
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Choudhury, F.
;
de Marneffe, Jean-Francois
;
Baklanov, Mikhaïl
;
King, S.
;
Nishi, Y.
;
Shohet, J.
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1870
since deposited on 2021-10-22
Acq. date: 2025-10-25
Citations
Metrics
Views
1870
since deposited on 2021-10-22
Acq. date: 2025-10-25
Citations